The energy dependence of the electron mean free path

C. D. Wagner, Lawrence E. Davis, William M. Riggs

Surface and Interface Analysis · 1980 · 225 citations · 12 references

Concepts

Abstract

Abstract Experiments providing multi‐point data on electron mean free paths vs. energy in pure materials have been reviewed for energies from 150 to 4000 eV. With the assumption that the simple equation λ= k E m can approximate the data, one obtains values of m between 0.53 and 0.80. Observations by ESCA of widely spaced photoelectron lines for Mg, Cu, Zn, Ga, Ge and As also lead to the conclusion that the exponent is considerably larger than 0.5, and is more likely in the range 0.65‐0.75.

References

12