Stability of polythiophene-based transistors and circuits

Abstract

Detailed investigations on shelf life and operation lifetime of polymer field-effect transistors (PFETs) and circuits are reported. All examined devices consisted entirely of polymer materials except the electrodes. Regioregular poly(3-alkylthiophene) was used as a semiconductor. Unencapsulated devices were produced, stored, and measured under ambient conditions. The performance of PFETs was maintained for more than 12 months after production. Even under extreme conditions of 85 °C and 85% relative humidity, a stable shelf life of more than 1400 h was measured. Transistors exceeded a continuous operation time of 1000 h. Operation lifetimes showed that the degradation did not follow the Arrhenius lifetime-temperature relationship. Similar results were found for ring oscillators.