Journal of the Optical Society of America B · 2004 · 475 citations · 17 references
Natural SciencesMaterials SciencePhysicsCondensed Matter PhysicsMaterials CharacterizationSpectroscopyAbsorption SpectroscopyOptical Properties Of MaterialsRefractive IndexSilicon MaterialsTerahertz PhotonicsTerahertz SpectroscopyCrystalline SiliconRefractionSiliconTerahertz Absorption SpectroscopyTerahertz Dielectric SpectroscopyTerahertz Material CharacterizationTerahertz Time-domain SpectroscopyTime-domain Terahertz Spectroscopy
The far-infrared absorption and index of refraction of high-resistivity, float-zone, crystalline silicon has been measured by terahertz time-domain spectroscopy. The measured new upper limit for the absorption of this most transparent dielectric material in the far infrared shows unprecedented transparency over the range from 0.5 to 2.5 THz and a well-resolved absorption feature at 3.6 THz. The index of refraction shows remarkably little dispersion, changing by only 0.0001 over the range from 0.5 to 4.5 THz.
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