MOSFET modeling for design of ultra-high performance infrared CMOS imagers working at cryogenic temperatures: Case of an analog/digital 0.18μm CMOS process - Concepedia

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MOSFET modeling for design of ultra-high performance infrared CMOS imagers working at cryogenic temperatures: Case of an analog/digital 0.18μm CMOS process

17

Citations

14

References

2011

Year

P. Martin, A.S. Royet, Fabrice Guellec, G. Ghibaudo

Solid-State Electronics

Electrical EngineeringEngineeringVlsi DesignInfrared SensorBias Temperature InstabilityCryogenicsApplied PhysicsCmos ImagersComputer EngineeringAnalog/digital 0.18μMMicroelectronicsCmos Process

References

	Year	Citations

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