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Transport study of self-supporting porous silicon
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1995
Year
Transport StudyEngineeringDark Dc ConductivityTof MeasurementsPorous MembraneOptoelectronic DevicesSilicon On InsulatorPorous BodySemiconductor DeviceSemiconductorsTransport PhenomenaElectronic PackagingCharge Carrier TransportMaterials ScienceSemiconductor TechnologyPhysicsSemiconductor MaterialCollected ChargeSurface ScienceApplied PhysicsThin Films
We have measured dark DC conductivity and time-of-flight (TOF) of carriers in self-supporting porous silicon films in the temperature range 298–480 K. The dark I-V curves show superlinear behavior with activation energies of 0.38–0.67 eV. The TOF measurements allowed us to evaluate the drift-length of non-equilibrium carriers and revealed a significant decrease of the collected charge with increasing delay (tdel≥1 ms) of the exciting 3 ns laser pulse after the voltage application, probably due to field redistribution in the Si crystallites.