In situ Nanomechanical Characterization of Single‐Crystalline Boron Nanowires by Buckling

Abstract

Nanomechanical characterization of single-crystalline boron nanowires is carried out by buckling individual nanowires with a nanomanipulator inside a scanning electron microscope in situ. The buckling behavior is studied and the applied load curves analyzed. A general calibration procedure for precisely measuring the mechanical properties of nanowires is established.