Reconciling STEM and X-ray Scattering Data from a Poly(styrene-<i>r</i><i>an</i>-methacrylic acid) Ionomer: Ionic Aggregate Size

Abstract

ADVERTISEMENT RETURN TO ISSUEPREVCommunication to the...Communication to the EditorNEXTReconciling STEM and X-ray Scattering Data from a Poly(styrene-ran-methacrylic acid) Ionomer: Ionic Aggregate SizeNicholas M. Benetatos, Paul A. Heiney, and Karen I. WineyView Author Information Department of Materials Science and Engineering, Department of Physics and Astronomy, University of Pennsylvania, Philadelphia, Pennsylvania 19104-6272 Cite this: Macromolecules 2006, 39, 16, 5174–5176Publication Date (Web):July 6, 2006Publication History Received21 April 2006Revised26 May 2006Published online6 July 2006Published inissue 1 August 2006https://pubs.acs.org/doi/10.1021/ma0608976https://doi.org/10.1021/ma0608976rapid-communicationACS PublicationsCopyright © 2006 American Chemical SocietyRequest reuse permissionsArticle Views420Altmetric-Citations33LEARN ABOUT THESE METRICSArticle Views are the COUNTER-compliant sum of full text article downloads since November 2008 (both PDF and HTML) across all institutions and individuals. These metrics are regularly updated to reflect usage leading up to the last few days.Citations are the number of other articles citing this article, calculated by Crossref and updated daily. Find more information about Crossref citation counts.The Altmetric Attention Score is a quantitative measure of the attention that a research article has received online. Clicking on the donut icon will load a page at altmetric.com with additional details about the score and the social media presence for the given article. Find more information on the Altmetric Attention Score and how the score is calculated. Share Add toView InAdd Full Text with ReferenceAdd Description ExportRISCitationCitation and abstractCitation and referencesMore Options Share onFacebookTwitterWechatLinked InRedditEmail Other access optionsGet e-Alertsclose SUBJECTS:Ionomers,Morphology,Scanning transmission electron microscopy,Scattering,X-ray scattering Get e-Alerts