Publication | Closed Access
Reflectance Anisotropy of GaAs(100): Theory and Experiment
108
Citations
17
References
1998
Year
Optical MaterialsEngineeringMicroscopyOptical TestingSemiconductorsExperimental Reflectance AnisotropyElectron MicroscopyMicroscopy MethodOptical PropertiesMicroscopic Tight-binding TheoryCompound SemiconductorSurface ReconstructionMaterials SciencePhotonicsPhysicsReflectance AnisotropyScanning Probe MicroscopyApplied PhysicsElectron MicroscopeOptoelectronics
The reflectance anisotropy has been calculated by microscopic tight-binding theory for various configurations of the As-rich GaAs(100) $c(4\ifmmode\times\else\texttimes\fi{}4)$ and $(2\ifmmode\times\else\texttimes\fi{}4)$ reconstructions, based on precise atomic coordinates from ab initio total-energy minimization. The comparison to experimental reflectance anisotropy in combination with scanning tunneling microscopy and low energy electron diffraction allows one to identify precise correlations between structural units and optical features. Clear indications are obtained for the intermediate steps in the surface reconstruction transformation.
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