Concepedia

Publication | Closed Access

Failure and degradation mechanisms of high-power white light emitting diodes

DOI

113

Citations

18

References

2010

Year

Shih-Chun Yang, Pang Lin, Chien-Ping Wang, Sheng Huang, Chiu‐Ling Chen, Pei-Fang Chiang, An-Tse Lee, Mu-Tao Chu
Microelectronics Reliability

References

YearCitations

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