Procedia Engineering · 2014 · 12 citations · 36 references
Natural SciencesMaterials SciencePhysicsCondensed Matter PhysicsNanomaterialsSurface ScienceAb Initio MethodsAtomic Force MicroscopyCrystallographyDensity Functional TheorySurface CrystallographySurface PhysicsElectronic Structure AnalysisElectronic Structure SimulationGrapheneGraphene HeterostructuresGraphene MaterialsGraphene NanostructuresGraphene-based Materials
The simultaneous combination of scanning probe methods (tunneling and force microscopies, STM and AFM) is a unique way to get information about crystallographic and electronic structure of the studied surface. Here we apply these methods accompanied by the state- of-the-art density functional theory (DFT) calculations to shed a light on the structure and electronic properties of the strongly-corrugated graphene/Rh(111) system. The atomically-resolved images are obtained for both STM and AFM modes and compared with the DFT results showing good agreement between theory and experiment.
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Generalized Gradient Approximation Made Simple
John P. Perdew, Kieron Burke, Matthias Ernzerhof · Physical Review Letters · 1996 · 211.5K citations · Full text
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Projector augmented-wave method
Peter E. Blöchl · Physical review. B, Condensed matter · 1994 · 90.8K citations
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Roll-to-roll production of 30-inch graphene films for transparent electrodes
Sukang Bae, Hyeongkeun Kim, Youngbin Lee et al. · Nature Nanotechnology · 2010 · 8.1K citations · Full text
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