Combined synchrotron X-ray and image-correlation analyses of biaxially deformed W/Cu nanocomposite thin films on Kapton

Abstract

In situ biaxial tensile tests within the elastic domain were conducted with W/Cu nanocomposite thin films deposited on a polyimide cruciform substrate using a biaxial testing machine developed on the DiffAbs beamline at the Synchrotron SOLEIL. The mechanical behaviour of the nanocomposite was characterized at the micro- and macroscales using synchrotron X-ray diffraction and digital image-correlation techniques simultaneously. Strain analyses for equibiaxial and non-equibiaxial loading paths were carried out. The results show that the two strain measurements match to within 1 × 10 −4 in the elastic domain for strain levels less than 0.3% and for both loading paths.