Japanese Journal of Applied Physics · 1985 · 127 citations · 8 references
Natural SciencesChemistryMaterials ScienceSpectroscopySurface ChemistrySurface ScienceSurface AnalysisSurface CharacterizationSurface Chemistry Of SolidsSurface PhysicsSurface SpectroscopyX-ray SpectroscopyCharacteristic X-ray EmissionRadiation Detection EfficiencyRefractionSurface Chemistry AnalysisSurface Composition AnalysisSurface SensitivityX-ray ReflectionX-ray Reflectivity
A new method for chemical analysis of surfaces by total-reflection-angle X-ray spectroscopy in RHEED experiments (RHEED-TRAXS) has been developed. When the X-ray take-off angle is set to be the critical angle for total reflection of the characteristic X-ray emitted from the deposited atoms on surfaces, the detection efficiency for the deposit becomes drastically higher owing to the refraction effect of the X-ray. This enhancement of surface sensitivity is demonstrated with Ag on Si(111). The smallest detectable amount of Ag is about 0.01 monolayer or less. This sensitivity is comparable to or higher than that of AES.
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