Concepedia

Strain mapping near a triple junction in strained Ni-based alloy using EBSD and biaxial nanogauges

A. K. Saint Clair, M. Foucault, Olivier Calonne, Y. Lacroute, Laurent Markey, J.M. Salazar, V. Vignal, Éric Finot

Acta Materialia · 2011 · 133 citations · 26 references

DOI

Concepts

References

26

Review Grain and subgrain characterisation by electron backscatter diffraction

F.J. Humphreys · Journal of Materials Science · 2001 · 1K citations

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High-resolution elastic strain measurement from electron backscatter diffraction patterns: New levels of sensitivity

A.J. Wilkinson, Graham Meaden, D. J. Dingley · Ultramicroscopy · 2005 · 677 citations

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Analysis of the different slip systems activated by tension in a α/β titanium alloy in relation with local crystallographic orientation

Florent Bridier, Patrick Villechaise, J. Méndez · Acta Materialia · 2004 · 532 citations

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Electron diffraction based techniques in scanning electron microscopy of bulk materials

Micron · 1997 · 290 citations · Full text

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Electron diffraction based techniques in scanning electron microscopy of bulk materials

Oxford University Research Archive (ORA) (University of Oxford) · 1997 · 254 citations

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