Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 1985 · 12 citations · 0 references
Natural SciencesBiomedical EngineeringMechanical Behavior Of MaterialsDeformation AssessmentElastic DeformationHolographyInterferometryStrain AnalysisStrain MeasurementContour DataContouringExperimental Results InterpretationInterferometric Deformation MeasurementInterferometric Strain MeasurementOptical Strain MeasurementSpeckle InterferometrySpeckle Phenomena
A new electronic speckle pattern interferometric (ESPI) contouring technique, which is a variation of the holographic two beam illumination method, is described. Together with necessary mathematical derivations, experimental test results are reported. The system is an integrated part of a deformation measuring system where contour data will be used in strain analysis.