Impact parameter dependence of energy loss and target-electron-induced ionization for 27 MeV/u Xe35+ incident ions transmitted in [110] Si channels - Concepedia

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Impact parameter dependence of energy loss and target-electron-induced ionization for 27 MeV/u Xe35+ incident ions transmitted in [110] Si channels

41

Citations

10

References

1990

Year

A. L’Hoir, S. Andriamonje, R. Anne, N. V. de Castro Faria, M. Chevallier, C. M. S. Cohen, J. Dural, M. J. Gaillard, R. Genre, R. Kirsch,

Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms

Electrical EngineeringIon ImplantationEngineeringApplied PhysicsTarget-electron-induced IonizationSingle Event EffectsEnergy LossIon BeamIon EmissionMicroelectronicsImpact Parameter DependenceIon Process

References

	Year	Citations

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