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Semiconducting nanocrystalline iron disilicide thin films prepared by pulsed-laser ablation
50
Citations
11
References
2003
Year
Pulsed-laser AblationEngineeringLaser AblationAmorphous Iron SilicideFesi2 TargetThin Film Process TechnologySemiconductorsPulsed Laser DepositionThin Film ProcessingMaterials ScienceCrystalline DefectsNanotechnologyPulsed-laser DepositionLaser Processing TechnologyLaser-assisted DepositionSurface ScienceApplied PhysicsThin FilmsAmorphous Solid
Amorphous iron silicide was reported to be semiconducting as well as β-FeSi2, and it has received considerable attention from both the physical and engineering points of view. However, there have been few studies and its basic properties are still unknown. We could grow the semiconducting nanocrystalline iron disilicide thin films by pulsed-laser deposition using an FeSi2 target. They consist of crystallites with diameters ranging from 3 to 5 nm. The carrier density and the mobility at 300 K were 1.5×1019 cm−3 and 35 cm/V s, respectively.
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