Publication | Closed Access
Gradient etching of silicon-based thin films for depth-resolved measurements: The example of Raman crystallinity
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Citations
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References
2011
Year
Materials ScienceEngineeringRaman CrystallinityOptical PropertiesSilicon On InsulatorSurface ScienceApplied PhysicsPlasma EtchingThin FilmsSilicon-based Thin FilmsMicroelectronicsGradient EtchingNanolithography MethodThin Film Processing
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