Advanced Materials · 2007 · 237 citations · 27 references
Natural SciencesMaterials EngineeringMaterials ScienceElectrochemistryNanomaterialsNanotechnologyElectron MicroscopyMetal Oxide NanomaterialsNanoelectronicsNanowiresOxide SemiconductorsCurrent DensityEmission MeasurementField EmissionNanowire ArraysOxide NanowiresScanning Electron MicroscopySemiconductor NanowiresZinc Oxide Nanostructures
An effective in situ field-emission measurement system, in which the distance between the emitting source and counter electrode can be accurately measured and finely controlled by setting up a second stage inside a scanning electron microscopy chamber, is developed. It is found that nanowires with a density between 60 and 80 μm–2 (see figure) and of ca. 1 μm in length give the highest emitting current density.
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