Ultramicroscopy · 1996 · 76 citations · 6 references
Natural SciencesElectrical EngineeringPhysicsCondensed Matter PhysicsElectronic MaterialsOpticsElectron Beam PhysicsElectron DiffractionElectron MicroscopyFourier OpticsHolographyInterferometryExperimental Study DesignPhase Determination
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Detection limits in quantitative off-axis electron holography
W.J. de Ruijter, J. K. Weiss · Ultramicroscopy · 1993 · 122 citations
Artefacts in electron holography
Hannes Lichte, Dorin Geiger, Alexander Harscher et al. · Ultramicroscopy · 1996 · 54 citations
Parameters for high-resolution electron holography
Hannes Lichte · Ultramicroscopy · 1993 · 53 citations
Electron noise in off-axis image plane holography
Hannes Lichte, Karl‐Heinz Herrmann, Fr. Lenz · Optik · 1987 · 33 citations