Detection of local atomic ordering in high-resolution electron images of quasiamorphous materials

Abstract

This letter describes an image analysis technique capable of enhancing atomic ordering in high-resolution electron micrographs of quasiamorphous materials. The technique cross correlates the full micrograph with a template selected from the micrograph image field and examines the cross-correlation function (CCF) as a function of template dimension. A critical dimension is found for which the CCF yields evidence of local atomic ordering.