A high temperature attachment for an X-ray diffractometer for precision lattice parameter measurements

Abstract

A description is given of the design, construction and use of an attachment for an X-ray diffractometer which enables lattice parameters to be determined to 1 part in 20 000 at temperatures between room temperature and 1000°C. Special attention is given to the problems of temperature measurement and uniformity. The instrument also incorporates a device for specimen alignment.