Evaluation of electrically polar substances by electric scanning force microscopy. Part I: Measurement signals due to maxwell stress

Abstract

Abstract The electric scanning force microscope (EFM) is used for the high-resolution characterization of electrically polar substances. An EFM is considered, the tip of which is electrically conductive and has a given potential. The tip of the EFM is exposed to Maxwell stress caused by ferroelectric domains and sample permittivity. This Maxwell stress is analytically calculated in a one-dimensional model. The results of calculation are compared with the results of EFM measurements. The method for measuring ferroelectric domains is in particular discussed.