Publication | Closed Access
New tools for yield improvement in integrated circuit manufacturing: can they be applied to reliability?
29
Citations
13
References
1999
Year
ReliabilityIndustrial DesignNew ToolsReliability EngineeringEngineeringHardware ReliabilityIndustrial EngineeringIntegrated Circuit ManufacturingYield ImprovementSystems EngineeringYield OptimizationYield (Engineering)Production EngineeringCircuit ReliabilityElectronic Packaging
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