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Variation of yield with thickness in SIMS and PDMS: Measurements of secondary ion emission from organized molecular films

DOI

36

Citations

33

References

1988

Year

Gérard Bolbach, Ronald C. Beavis, S. Della‐Negra, C. Deprun, Werner Ens, Y. LeBeyec, Dennis E. Main, B. Schueler, K. G. Standing
Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms

References

YearCitations

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