Photoluminescence and X-ray characterization of relaxed Si1 − xGex alloys grown on silicon on insulator (SOI) and implanted SOI substrates - Concepedia

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Photoluminescence and X-ray characterization of relaxed Si1 − xGex alloys grown on silicon on insulator (SOI) and implanted SOI substrates

22

Citations

14

References

1997

Year

Michael Chu, M. O. Tanner, Fengyi Huang, Kang L. Wang, G. Chu, Mark S. Goorsky

Journal of Crystal Growth

Materials ScienceIon ImplantationEngineeringApplied PhysicsSemiconductor Device FabricationSilicon On InsulatorSoi SubstratesX-ray Characterization

References

	Year	Citations

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