Structural characterization of II‐VI semiconductor nanoparticles

Abstract

Abstract We present structure analysis techniques for nanoparticles, which use the explicit simulation of the nanoparticle structure. Data are based on X‐ray powder data, which are interpreted via the Debye equation and pair distribution function data. The techniques allow the exact determination of the nanoparticle structure, shape and defect structure. ZnO and ZnSe nanoparticles are of ellipsoidal shape with interatomic distance distribution equal to bulk phases. CdSe/ZnS forms core shell particles in which the ZnS shell is structurally incoherent to the core phase. All three materials are characterized by unusually high stacking fault density. (© 2007 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)