Electrical Conductivity of Thin Metallic Films with Unlike Surfaces

Abstract

A theoretical analysis, based on the Fuchs-Sondheimer formalism, is given of the conductivity of single-layer, thin metallic films in which the scattering of the conduction electrons is different at each surface. The electron-surface scattering is described by the parameters P and Q which represent the fractions of conduction electrons specularly scattered at each surface. Tables of normalized resistivity as a function of thickness divided by mean free path are given for various combinations of P and Q.