Polarized low-energy-electron diffraction from W(100)

Abstract

A set of polarized low-energy-electron diffraction (PLEED) data from a W(100) surface measured using a polarized electron beam is presented. The data include conventional LEED profiles $I(E,\ensuremath{\theta})$ as well as $S(E,\ensuremath{\theta})$ profiles which measure the spin dependence of the scattering. These profiles are obtained for specular beams at angles of incidence from 9\ifmmode^\circ\else\textdegree\fi{}-24\ifmmode^\circ\else\textdegree\fi{} and for five nonspecular beams at normal incidence. The potential usefulness of $S(E,\ensuremath{\theta})$ profiles for structure determination is discussed and the use of PLEED for spin analysis is assessed.