Creep at intermediate temperatures : An in situ study of the evolution of the cell boundaries in the high voltage electron microscope - Concepedia

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Creep at intermediate temperatures : An in situ study of the evolution of the cell boundaries in the high voltage electron microscope

28

Citations

3

References

1978

Year

М. M. Myshlyaev, D. Caillard, Juliette Martin

Scripta Metallurgica

Intermediate TemperaturesPhysicsMicroscopyElectron MicroscopyScanning Probe MicroscopyApplied PhysicsHigh VoltageElectron MicroscopeElectron DiffractionCell Boundaries

References

	Year	Citations

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