Parallel scanning tunneling microscopy imaging of low dimensional nanostructures

Abstract

A first generation of parallel scanning tunneling microscopy (STM) simulator has been developed to accelerate the production of high quality STM images. An efficient master-slave parallel scheme has been constructed specially suited for large scale problems in which the amount of data communications remains a small fraction of the entire calculation. We apply the new parallel scheme to two examples, benzene adsorption on a metal surface and standing wave patterns on the Cu(111) surface, highlighting the efficiency of our approach.