Microelectronics Reliability · 2012 · 79 citations · 5 references
EngineeringElectrical EngineeringMaterials ScienceHeat TransferMicroelectronicsSemiconductor DevicesSemiconductor Device MaterialsSemiconductor ReliabilityThermal ManagementThermal Properties Of MaterialsThermal Properties Of SemiconductorsThermal Resistance NetworksOperating ConditionsThermal Effects In Integrated CircuitsThermo Mechanical Stress AnalysisThermo-mechanical DeformationThermo-mechanical EffectsThermomechanical StressWire Bonding
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2011 IEEE Energy Conversion Congress and Exposition
Rafał Wróbel, Antonio Griffo, Adrian Młot et al. · European Conference on Cognitive Ergonomics · 2011 · 116 citations