Applied Physics Letters · 1989 · 28 citations · 11 references
EngineeringElectrical EngineeringMaterials ScienceElectronic MaterialsOptoelectronicsSemiconductor DevicesEtching ProcessesIii-v SemiconductorsLaser DiodesLaser PhysicsSemiconductor HeterostructuresSemiconductor LasersCurrent DensityDevice FabricationEtch Mask FabricationInternal ReflectionIon Beam EtchingSemiconductor Laser DiodesSemiconductor Laser FabricationTotal Internal Reflection
GaAs/AlGaAs semiconductor lasers with very high quality etched facets have been fabricated. Laser facets are formed by the chemically assisted ion beam etching technique with SiO2 as the etch mask. The threshold current densities of lasers produced with this technique are almost identical to comparable lasers with one etched and one cleaved facet. L-shaped lasers, which make use of total internal reflection, have also been fabricated. The threshold current density of L-shaped lasers is similar to that of rectangular lasers with comparable cavity length.
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Contrast enhanced photolithography
B. F. Griffing, Paul R. West · IEEE Electron Device Letters · 1983 · 41 citations