Concepedia

Soft fails in microelectronic circuits due to proton-induced nuclear reactions in material surrounding the SEU-sensitive volume

S.S. El-Teleaty, P.J. McNulty, W.G. Abdel-Kader, W.J. Beauvais

Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms · 1989 · 10 citations · 5 references

DOI

Concepts

References

5

Alpha-particle-induced field and enhanced collection of carriers

Chenming Hu · IEEE Electron Device Letters · 1982 · 193 citations

, , +10

Microdosimetric Aspects of Proton-Induced Nuclear Reactions in Thin Layers of Silicon

G. Farrell, P.J. McNulty · IEEE Transactions on Nuclear Science · 1982 · 45 citations

, , +14

Charge-Deposition Spectra in Thin Slabs of Silicon Induced by Energetic Protons

Shadia El Teleaty, G. Farrell, P.J. McNulty · IEEE Transactions on Nuclear Science · 1983 · 23 citations

, , +9

Microdosimetric Analysis of Proton Induced Reactions in Silicon and Gallium Arsenide

G. Farrell, P.J. McNulty, W.G. Abdel-Kader · IEEE Transactions on Nuclear Science · 1984 · 22 citations

, , +14

Methods for Calculating SEU Rates for Bipolar and NMOS Circuits

P.J. McNulty, W.G. Abdel-Kader, J. M. Bisgrove · IEEE Transactions on Nuclear Science · 1985 · 22 citations

, , +17