Soft fails in microelectronic circuits due to proton-induced nuclear reactions in material surrounding the SEU-sensitive volume - Concepedia

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Soft fails in microelectronic circuits due to proton-induced nuclear reactions in material surrounding the SEU-sensitive volume

10

Citations

5

References

1989

Year

S.S. El-Teleaty, P.J. McNulty, W.G. Abdel-Kader, W.J. Beauvais

Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms

Soft FailsDefect ToleranceEngineeringHigh-energy Nuclear ReactionPhysicsSoft ModeApplied PhysicsDefect FormationMicroelectronicsNuclear EngineeringMicroelectronic CircuitsSeu-sensitive Volume

References

	Year	Citations

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