Publication | Closed Access
Bias dependence of Si(111)7×7 images observed by noncontact atomic force microscopy
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Citations
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References
2000
Year
EngineeringElectron MicroscopyPhysicsCrystalline DefectsMicroscopyMicroscopy MethodSurface ScienceApplied PhysicsScanning Force MicroscopyScanning Probe MicroscopyAtomic PhysicsMicroanalysisBias Dependence
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