Journal of Materials Science Materials in Electronics · 2007 · 27 citations · 15 references
Natural SciencesMaterials SciencePhysicsOptical MaterialsOpticsThin FilmsOptical Properties Of MaterialsOptical Properties Of SolidsOptical SpectroscopyOptical Thin FilmsRefractive IndexThin Film Optical PropertiesNanocrystalline MaterialsOptical CharacterizationOptical PropertiesSurface Optical PropertiesThin-film Optical Characterization
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<i>Ellipsometry and Polarized Light</i>
R. M. A. Azzam, N. M. Bashara, Stanley S. Ballard · Physics Today · 1978 · 4.3K citations
Natural Sciences, Physics, Optics +13
Ellipsometry and polarized light
H.G. Jerrard · Optics & Laser Technology · 1978 · 748 citations
Optical Dispersion and the Structure of Solids
S. H. Wemple, M. DiDomenico · Physical Review Letters · 1969 · 465 citations
S. Jiao, Anirudha V. Sumant, M. A. Kirk et al. · Journal of Applied Physics · 2001 · 176 citations · Full text
Natural Sciences, Materials Engineering, Materials Science +17
Haemocompatibility studies on carbon-based thin films by ellipsometry
S. Logothetidis, M. Gioti, S. Lousinian et al. · Thin Solid Films · 2005 · 58 citations