Specimen Charging in the Electron Microscope and Some Observations on the Size of Polystyrene Latex Particles

Abstract

From observations in the shadow electron microscope and the standard electron microscope it is concluded that specimen charging does not significantly change the magnification of the latter, provided that the specimen is less than a few microns in thickness and the illuminating electron beam simultaneously strikes a nearby grounded conductor such as the supporting mesh. The difference in size of shadowed and unshadowed Dow Latex 580G, lot 3584 reported by Kern and Kern (J. Appl. Phys. 21, 705 (1950)) is attributed to an added layer of material on the shadowed particles. Evidence in support of this view is presented, and the results of other workers are discussed in the light of it.