Publication | Open Access
Direct observation of the core structures of threading dislocations in GaN
173
Citations
10
References
1998
Year
Materials ScienceHexagonal GanWide-bandgap SemiconductorEngineeringDislocation InteractionPhysicsApplied PhysicsCondensed Matter PhysicsDirect ObservationBand GapCore StructuresAluminum Gallium NitrideDefect FormationGan Power DeviceCategoryiii-v SemiconductorDislocation CoresMicrostructure
Here we present the first direct observation of the atomic structure of threading dislocation cores in hexagonal GaN. Using atomic-resolution Z-contrast imaging, dislocations with edge character are found to exhibit an eight-fold ring core. The central column in the core of a pure edge dislocation has the same configuration as one row of dimers on the {10-10} surface. Following recent theoretical work, it is proposed that edge dislocations do not have deep defect states in the band gap, and do not contribute to cathodoluminescence dislocation contrast. On the other hand, both mixed and pure screw dislocations are found to have a full core, and full screw dislocation cores were calculated to have states in the gap.
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