Publication | Closed Access
GaN/AlN-based quantum-well infrared photodetector for 1.55 μm
146
Citations
13
References
2003
Year
Optical MaterialsEngineeringPhotocurrent MeasurementsOptical AbsorptionOptoelectronic DevicesSemiconductorsPhotodetectorsOptical PropertiesPhotonicsElectrical EngineeringPhotoluminescencePhysicsOptoelectronic MaterialsAluminum Gallium NitrideGan/aln-based SuperlatticeCategoryiii-v SemiconductorSolid-state LightingApplied PhysicsGan Power DeviceOptoelectronics
We report optical absorption and photocurrent measurements on a GaN/AlN-based superlattice. The optical absorption has a full width at half maximum of 120 meV and takes place at an energy of 660 meV (5270 cm−1); this corresponds to a wavelength of 1.9 μm. While the optical absorption remained unchanged up to room temperature, the photocurrent signal could be observed up to 170 K. With respect to the optical absorption, the photocurrent peak was slightly blueshifted (710 meV/5670 cm−1) and had a narrower width of 115 meV. Using this quantum-well infrared photodetector, we were able to measure the spectrum of a 1.55 μm superluminescent light-emitting diode.
| Year | Citations | |
|---|---|---|
Page 1
Page 1