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Hopping model for charge transport in amorphous carbon
67
Citations
43
References
2001
Year
EngineeringCharge TransportMolecular DynamicsThermal ConductivitySemiconductorsElectronic DevicesTransport PhenomenaThermodynamicsThermal ConductionCharge Carrier TransportNumerical Hopping ModelElectrical EngineeringPhysicsThermal TransportElectrical PropertyElectronic MaterialsCondensed Matter PhysicsLow-temperature PhysicsApplied PhysicsFermi LevelLocalized StatesAmorphous Solid
Abstract A numerical hopping model is developed to investigate the temperature dependence of electrical conductivity in a distribution of localized states. An exponential energy dependence of the density-of-states (DOS) distribution (N 0/E 0)exp(E/E 0) is assumed, together with a high DOS value (1 × 1018-1 × 1021cm−3 eV−1) at the Fermi level. The low-field dc conductivity is dominated by a subset of the localized states centred at a mean transport energy E t located well above E t; both E t and the distribution width (ΔE ≫ kT) increase with increasing temperature, in the range 50–500 K. It is found that the effective activation energy E act and apparent conductivity pre-factor σ0 both increase with increasing temperature. In any given temperature range, E act decreases with increasing DOS at E F, while σ0 decreases exponentially with increasing E 0. A linear relationship between log(σT 1/2) and T −1/4 is predicted up to high temperatures with a strong positive correlation between the pre-factor σ00 and the slope T1/4 0. This model is applied to electrical transport in amorphous carbon and carbon alloys where bonding and antibonding π orbitals produce highly localized states decoupled from extended a states. Unlike the classical variable-range hopping at the Fermi level, this model describes experimental data using physically acceptable values of N(EF), E0 and the localization radius 1/γ = 5 Å. Its predictions provide a framework to understand the increased conductivity brought about by ‘dopant’ atom incorporation.
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