Transport properties of thin iron pyrite films

Abstract

Siemiconducting thin iron pyrite films are grown by thermal evaporation. The resistivity of the films is measured in the thickness range 10 to 150 nm. Other correlated experimental techniques like Hall effect and TCR are used to confirm the semiconducting nature of the films. The films of thickness higher than 50 nm yield the saturated value for the resistivity. The F-S theory is used to estimate the mean free path of the carriers.