Unsupervised detection of surface defects: A two-step approach

Abstract

In this paper, we focus on the problem of finding anomalies in surface images. Despite enormous research efforts and advances, it still remains a big challenge to be solved. This paper proposes a unified approach for defect detection. Our proposed method consists of two phases: (1) global estimation and (2) local refinement. First, we roughly estimate defects by applying a spectral-based approach in a global manner. We then locally refine the estimated region based on the distributions of pixel intensities derived from defect and defect-free regions. Experimental results show that the proposed method outperforms the previous defect detection methods and gives robust results even in noisy surface defect images.