Publication | Closed Access
Crystallization study of chemically vapour-deposited amorphous silicon films by in situ x-ray diffraction
24
Citations
4
References
1985
Year
Materials ScienceEngineeringSilicon On InsulatorSurface ScienceApplied PhysicsSitu X-ray DiffractionCrystallization StudyThin FilmsAmorphous SolidCrystallographyChemical Vapor DepositionThin Film Processing
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