X-ray reflectivity study of r.f.-sputtered thin SiO2 films

Surface Studies of Solids by Total Reflection of X-Rays

L. G. Parratt · Physical Review · 1954 · 5.1K citations

Natural Sciences, Chemistry, Materials Science +15

An X-ray scattering study of lipid monolayers at the air-water interface and on solid supports

J. Als-Neilsen, C.A. Heln, P. Tippmann‐Krayer et al. · Thin Solid Films · 1988 · 97 citations

Natural Sciences, Biophysics, Chemistry +17

Atomic structure at the (111) Si-SiO2 interface

Richard Haight, L. C. Feldman · Journal of Applied Physics · 1982 · 85 citations

Natural Sciences, Materials Engineering, Materials Science +14

The structure of silica glass

Th. Gerber, B. Himmel · Journal of Non-Crystalline Solids · 1986 · 52 citations

Natural Sciences, Materials Engineering, Materials Science +7

X-ray reflectivity study of SiO2 on Si

Steve M. Heald, J.K.D.S. Jayanetti, A. A. Bright et al. · Journal of Vacuum Science & Technology A Vacuum Surfaces and Films · 1990 · 24 citations

Natural Sciences, Materials Engineering, Materials Science +17