Publication | Closed Access
Low-energy electron microscopy of nanoscale three-dimensional SiGe islands on Si(100)
23
Citations
26
References
1998
Year
Materials ScienceEngineeringElectron MicroscopyMicroscopyNanotechnologyScanning Probe MicroscopyApplied PhysicsElectron MicroscopeSilicon On InsulatorLow-energy Electron Microscopy
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