Thermoelectric Characteristics of a Commercialized Mg2Si Source Doped with Al, Bi, Ag, and Cu

Abstract

The thermoelectric characteristics of commercial polycrystalline Mg2Si doped with Bi, Al + Bi, Ag, and Cu were examined. The samples for the thermoelectric measurements were prepared using the plasma-activated sintering (PAS) technique. The measured values of the Seebeck coefficient were compared with values calculated using the all-electron band-structure calculation package (ABCAP) based on a full-potential augmented-plane-wave (FLAPW) band-structure calculation in a local density approximation (LDA). For the Bi + Al-co-doped samples, the observed values of the dimensionless figure of merit, ZT, were higher than those of solely Bi-doped samples. The maximum value obtained for Bi + Al-doped Mg2Si was 0.77 at 862 K. For the Ag-doped samples, ZT was significantly lower than that of the Bi + Al-doped samples, with the maximum value being about 0.11 at 873 K.