Publication | Closed Access
Resolution and Sensitivity Considerations of an Auger Electron Spectrometer Based on Display LEED Optics
191
Citations
13
References
1969
Year
EngineeringAuger Electron SpectrometerRetarding Field AnalyzerMicroscopyMeasurementElectron OpticSensitivity ConsiderationsElectron SpectroscopyCalibrationOptical DiagnosticsInstrumentationElectrical EngineeringPhysicsDisplay Leed OpticsInstrumental LinewidthNatural SciencesSpectroscopyInstrument ScienceApplied PhysicsElectron MicroscopeInstrument DevelopmentElectronic InstrumentationOptoelectronics
Some of the important considerations in the design of a retarding field analyzer suitable for Auger electron spectroscopy based on display LEED optics are described. From such considerations an instrument has been built with an instrumental linewidth of less than 0.3% (resolution greater than 360). Analysis is made of the limitations insensitivity of the device due to shot noise, and on this basis a comparison is made with a 127° cylindrical electrostatic analyzer. The analysis can be readily extended to other forms of retarding field and deflection analyzers.
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