Error analysis for ultra dense nanomagnet logic circuits

Abstract

Dependency of errors in nanomagnet logic datalines on the dipole coupling strength is investigated. Evolution of different types of errors at different coupling strengths is studied. Dipole coupling strength in datalines is varied by changing the inter-magnet spacing from 30 nm to 10 nm and the aspect ratios of the 20-nm-thick Supermalloy (Ni79Fe16Mo5) dots from 90 × 60 nm2 to 120 × 60 nm2. An error rate improvement up to 46% is observed for inter-magnet space reduction from 30 nm to 10 nm. Error rates in datalines with larger spacing are dominated by premature switching, whereas a new type of error, due to the stronger influence of the driver magnets, dominates in datalines with tighter (sub-20-nm) spacing. For same spacing, datalines with lower aspect ratio magnets show higher error rates compared to those with higher aspect ratio.