Temperature Dependence of Three-Terminal Molecular Junctions with Sulfur End-Functionalized Tercyclohexylidenes

Menno Poot, Edgar A. Osorio, Kevin M. O'neill, Jos Thijssen, Daniël Vanmaekelbergh, Cornelis A. van Walree, Leonardus W. Jenneskens, Herre S. J. van der Zant

Nano Letters · 2006 · 123 citations · 19 references

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Abstract

We have studied the gate and temperature dependence of molecular junctions containing sulfur end-functionalized tercyclohexylidenes. At low temperatures we find temperature-independent transport; at temperatures above 150 K the current increases exponentially with increasing temperature. Over the entire temperature range (10−300 K), and for different gate voltages, a simple toy model of transport through a single level describes the experimental results. In the model, the temperature dependence arises from the Fermi distribution in the leads and in a three-parameter fit we extract the level position and the tunnel rates at the left and right contact. We find that these parameters increase as the bias voltage increases.

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