Publication | Closed Access
Electrical characterizations of resistive random access memory devices based on GaV4S8 thin layers
20
Citations
9
References
2012
Year
Hardware SecurityNon-volatile MemoryElectrical EngineeringEngineeringElectrical CharacterizationsApplied PhysicsMemory DeviceMemory DevicesSemiconductor MemoryResistive Random-access MemoryMicroelectronicsGav4s8 Thin Layers
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