Design Philosophy for High-Resolution Rate and Throughput Spectroscopy Systems

Abstract

The paper describes the philosophy behind the design of a pulse processing system used in a semiconductor detector x-ray spectrometer to be used for plasma diagnostics at the Princeton TFTR facility. This application presents the unusual problems of very high counting rates and a high-energy neutron background while still requiring excellent resolution. To meet these requirements three specific new advances are included in the design: (i) A symmetrical triangular pulse shape is employed in the main pulse-processing channel. A new simple method of generating a close approximation to the symmetrical triangle has been developed. (ii) To cope with the very wide dynamic range of signals while maintaining a constant fast resolving time, approximately symmetrical triangular pulse shaping is also used in the fast pulse pile-up inspection channel. (iii) The demand for high throughput has resulted in a re-examination of the operation of pile-up rejectors and pulse stretchers. As a result a technique has been developed that, for a given total pulse shaping time, permits approximately a 40% increase in throughput in the system. Performance results obtained using the new techniques are presented.